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  1. KOVÁČ, Urban et al. Hierarchical Simulation of Statistical Variability : From 3-D MC with "Ab Initio” Ionized Impurity Scattering to Statistical Compact Models. In IEEE Transactions on Electron Devices. - New York : IEEE Electron Devices Society. ISSN 1557-9646, 2010, vol. 57, no. 10, s. 2418-2426. Available on Internet: <http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5551189>
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