KOVÁČ, Urban - ALEXANDER, Craig - ASENOV, Asen. Statistical estimation of electrostatic and transport contributions to device parameter variation. In IWCE 2010 : 14th international workshop on computational electronics. - [s.l.] : IEEE, 2010. ISBN 978-1-4244-9383-8, s. [1-4]. Available on Internet: <http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5677971>