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  1. ASENOV, Asen et al. Modeling and simulation of transistor and circuit variability and reliability. In Custom Integrated Circuits Conference (CICC) : 32nd annual CICC. - New York : IEEE, 2010. ISBN 978-1-4244-5760-1, s. [1-8]. Available on Internet: <http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=05617627>
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