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  1. LANGE, André et al. A general approach for multivariate statistical MOSFET compact modeling preserving correlations. In Solid-state device research conference (ESSDERC) : proceedings of the European, 12-16 September 2011. - [s.l. s.n.], 2011. ISBN 978-1-4577-0706-3. ISSN 1930-8876, s. 163-166.
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