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1.Microelectronics and Reliability

Microelectronics and Reliability. - Registrovaný: Current Contents Connect, Registrovaný: Web of Science, Registrovaný: Scopus. Oxford : Elsevier. 12x ročne. ISSN 1872-941X. Available on Internet: https://www.sciencedirect.com/journal/microelectronics-reliability
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