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Statistical estimation of electrostatic and transport contributions to device parameter variation
Title Statistical estimation of electrostatic and transport contributions to device parameter variation Author info Urban Kováč, Craig Alexander, Asen Asenov Author Kováč Urban EUBFNHKFI - Katedra financií FNH Co-authors Alexander Craig Asenov Asen Source document IWCE 2010 : 14th international workshop on computational electronics : Pisa, Italy, 26-29 October 2010. S. [1-4]. - [s.l.] : IEEE, 2010. ISBN 978-1-4244-9383-8 Document kind schedule of articles from year books Language English Country of Edition United States of America URL http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5677971 Public work category Reports at international scientific conferences Database PUBLIKAČNÁ ČINNOSŤ No. of Archival Copy E10 01523-001, kópia plného textu
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