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Modeling and simulation of transistor and circuit variability and reliability
Title Modeling and simulation of transistor and circuit variability and reliability Author info Asen Asenov, Binjie Cheng, D. Dideban, Urban Kováč, N. Moezi, Campbell Millar, Gareth Roy, Adrew R. Brown, Scott Roy Author Asenov Asen Co-authors Cheng Binjie Dideban D. Kováč Urban EUBFNHKFI - Katedra financií FNH Moezi N. Millar Campbell Roy Gareth Brown Adrew R. Roy Scott Source document Custom Integrated Circuits Conference (CICC) : 32nd annual CICC : San Jose, CA, September 19-22, 2010. S. [1-8]. - New York : IEEE, 2010. ISBN 978-1-4244-5760-1 Document kind schedule of articles from year books Language English Country of Edition United States of America URL http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=05617627 Public work category Reports at international scientific conferences Database PUBLIKAČNÁ ČINNOSŤ No. of Archival Copy E10 01522-001, kópia plného textu
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