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Advanced simulation of statistical variability and reliability in nano CMOS transistors
Title Advanced simulation of statistical variability and reliability in nano CMOS transistors Author info Asen Asenov, Scott Roy, Adrew R. Brown, Gareth Roy, Craig Alexander, Craig Riddet, Campbell Millar, Binjie Cheng, Antonio Martinez, Natalia Seoane, Dave Reid, M.F. Bukhori, X. Wang, Urban Kováč Author Asenov Asen Co-authors Roy Scott Brown Adrew R. Roy Gareth Alexander Craig Riddet Craig Millar Campbell Cheng Binjie Martinez Antonio Seoane Natalia Reid Dave Bukhori M.F. Wang X. Kováč Urban EUBFNHKFI - Katedra financií FNH Source document IEEE International electron devices meeting 2008 : San Francisco, CA, December 15-17, 2008. - New York : IEEE, 2008. ISBN 978-1-4244-2377-4 Document kind schedule of articles from year books Language English Country of Edition United States of America URL http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4796712&tag=1 Public work category Reports at international scientific conferences Database PUBLIKAČNÁ ČINNOSŤ No. of Archival Copy E08 01853-001, kópia plného textu
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