Number of the records: 1  

Fundamental and applied metrology

  1. Fundamental and Applied Metrology. World congress. Fundamental and applied metrology : IMEKO XIX world congress : proccedings : september 6-11, 2009 - Lisbon, Portugal. [Budapest] : IMEKO, 2009. CD-ROM. ISBN 978-963-88410-0-1.
Number of the records: 1  

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