Number of the records: 1
Microelectronics and Reliability
SYS 0270009 LBL 00000nas1-22^^^^^---450- 005 20230803133430.7 011 $a 1872-941X $b (online) 011 $a 0026-2714 $b (print) 100 $a 20201123d20089999m--y0sloc0103----ba 101 0-
$a eng 102 $a GB 110 $a afa 200 1-
$a Microelectronics and Reliability 210 $a Oxford $c Elsevier 321 1-
$a Registrovaný: Current Contents Connect 321 1-
$a Registrovaný: Web of Science 321 1-
$a Registrovaný: Scopus 326 $a 12x ročne 801 -0
$a SK 856 4-
$u https://www.sciencedirect.com/journal/microelectronics-reliability
Number of the records: 1