ASENOV, P. et al. The compact modelling strategy on SNM and read current variability in modern SRAM. In Simulation of Semiconductor Processes and Devices (SISPAD) 2011 : international conference, September 8-10, 2011, Osaka, Japan. - [Japan] : IEEE, 2011. ISBN 978-1-61284-419-0. ISSN 1946-1569, s. 283-286. Available on Internet: <http://ieeexplore.ieee.org/search/srchabstract.jsp?tp=&arnumber=6035024>