1. Advanced simulation of statistical variability and reliability in nano CMOS transistors
Title | Advanced simulation of statistical variability and reliability in nano CMOS transistors |
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Author info | Asen Asenov, Scott Roy, Adrew R. Brown, Gareth Roy, Craig Alexander, Craig Riddet, Campbell Millar, Binjie Cheng, Antonio Martinez, Natalia Seoane, Dave Reid, M.F. Bukhori, X. Wang, Urban Kováč |
Author | Asenov Asen |
Co-authors | Roy Scott |
Brown Adrew R. | |
Roy Gareth | |
Alexander Craig | |
Riddet Craig | |
Millar Campbell | |
Cheng Binjie | |
Martinez Antonio | |
Seoane Natalia | |
Reid Dave | |
Bukhori M.F. | |
Wang X. | |
Kováč Urban EUBFNHKFI - Katedra financií FNH | |
Source document | IEEE International electron devices meeting 2008 : San Francisco, CA, December 15-17, 2008. - New York : IEEE, 2008. ISBN 978-1-4244-2377-4 |
Document kind | schedule of articles from year books |
Language | English |
Country of Edition | United States of America |
URL | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4796712&tag=1 |
Public work category | Reports at international scientific conferences |
Database | PUBLIKAČNÁ ČINNOSŤ |
No. of Archival Copy | E08 01853-001, kópia plného textu |