1. Modeling and simulation of transistor and circuit variability and reliability
Title | Modeling and simulation of transistor and circuit variability and reliability |
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Author info | Asen Asenov, Binjie Cheng, D. Dideban, Urban Kováč, N. Moezi, Campbell Millar, Gareth Roy, Adrew R. Brown, Scott Roy |
Author | Asenov Asen |
Co-authors | Cheng Binjie |
Dideban D. | |
Kováč Urban EUBFNHKFI - Katedra financií FNH | |
Moezi N. | |
Millar Campbell | |
Roy Gareth | |
Brown Adrew R. | |
Roy Scott | |
Source document | Custom Integrated Circuits Conference (CICC) : 32nd annual CICC : San Jose, CA, September 19-22, 2010. S. [1-8]. - New York : IEEE, 2010. ISBN 978-1-4244-5760-1 |
Document kind | schedule of articles from year books |
Language | English |
Country of Edition | United States of America |
URL | http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=05617627 |
Public work category | Reports at international scientific conferences |
Database | PUBLIKAČNÁ ČINNOSŤ |
No. of Archival Copy | E10 01522-001, kópia plného textu |