ASENOV, Asen et al. Advanced simulation of statistical variability and reliability in nano CMOS transistors. In IEEE International electron devices meeting 2008 : San Francisco, CA, December 15-17, 2008. - New York : IEEE, 2008. ISBN 978-1-4244-2377-4. Available on Internet: <http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4796712&tag=1>