Search results

Records found: 1  
Your query: Author Sysno = "^eu_un_auth 0035406^"
  1. CAFMET 2010. International metrology conference. CAFMET 2010 : proceedings of third international metrology conference : exhibition on quality, measurement and instrumentation : april 18-23, 2010, Cairo, Egypt. Paríž : CAFMET, 2010. CD-ROM.
    electonic book

    electonic book



  This site uses cookies to make them easier to browse. Learn more about how we use cookies.