Počet záznamov: 1
A unified density gradient approach to ‘ab-initio’ ionised impurity scattering in 3D MC simulations of nano-CMOS variability
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$a A unified density gradient approach to ‘ab-initio’ ionised impurity scattering in 3D MC simulations of nano-CMOS variability $f Alexander Craig, Urban Kováč, Gareth Roy, Scott Roy, Asen Asenov 463 -1
$1 010 $a 978-1-4244-3705-4 $1 200 1 $a ULIS 2009 $b elektronický zdroj $e 10th International conference on ULtimate Integration of Silicon, Aachen, 18-20 march, 2009 $v S. 43-46 $1 210 $a USA $c IEEE $d 2009 675 $v 1. stred. $z slo 700 -1
$3 eu_un_auth*0037770 $a Craig $b Alexander $4 070 $9 0,25 701 -1
$3 eu_un_auth*p0056135 $a Kováč $b Urban $p EUBFNHKFI $9 99 $4 070 $T Katedra financií FNH 701 -1
$3 eu_un_auth*0037768 $a Roy $b Gareth $4 070 $9 0,25 701 -1
$3 eu_un_auth*0037775 $a Roy $b Scott $4 070 $9 0,25 701 -1
$3 eu_un_auth*0037769 $a Asenov $b Asen $4 070 $9 0,25 801 -0
$a SK $b BA004 $c 20110407 $g AACR2 856 4-
$u http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4897535
Počet záznamov: 1