Počet záznamov: 1
Advanced simulation of statistical variability and reliability in nano CMOS transistors
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$a Advanced simulation of statistical variability and reliability in nano CMOS transistors $f Asen Asenov, Scott Roy, Adrew R. Brown, Gareth Roy, Craig Alexander, Craig Riddet, Campbell Millar, Binjie Cheng, Antonio Martinez, Natalia Seoane, Dave Reid, M.F. Bukhori, X. Wang, Urban Kováč 463 -1
$1 010 $a 978-1-4244-2377-4 $1 200 1 $a IEEE International electron devices meeting 2008 $e San Francisco, CA, December 15-17, 2008 $1 210 $a New York $c IEEE $d 2008 675 $v 1. stred. $z slo 700 -1
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$3 eu_un_auth*0037776 $a Brown $b Adrew R. $4 070 701 -1
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$3 eu_un_auth*0037777 $a Alexander $b Craig $4 070 701 -1
$3 eu_un_auth*0037785 $a Riddet $b Craig $4 070 701 -1
$3 eu_un_auth*0037784 $a Millar $b Campbell $4 070 701 -1
$3 eu_un_auth*p0014753 $a Cheng $b Binjie $4 070 701 -1
$3 eu_un_auth*0037773 $a Martinez $b Antonio $4 070 701 -1
$3 eu_un_auth*0037774 $a Seoane $b Natalia $4 070 701 -1
$3 eu_un_auth*0037783 $a Reid $b Dave $4 070 701 -1
$3 eu_un_auth*0037788 $a Bukhori $b M.F. $4 070 701 -1
$3 eu_un_auth*0037789 $a Wang $b X. $4 070 701 -1
$3 eu_un_auth*p0056135 $a Kováč $b Urban $p EUBFNHKFI $9 10 $4 070 $T Katedra financií FNH 801 -0
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Počet záznamov: 1