Počet záznamov: 1
Modeling and simulation of transistor and circuit variability and reliability
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$a eng $d eng 102 $a US 200 1-
$a Modeling and simulation of transistor and circuit variability and reliability $f Asen Asenov, Binjie Cheng, D. Dideban, Urban Kováč, N. Moezi, Campbell Millar, Gareth Roy, Adrew R. Brown, Scott Roy 463 -1
$1 010 $a 978-1-4244-5760-1 $1 200 1 $a Custom Integrated Circuits Conference (CICC) $b elektronický dokument $e 32nd annual CICC $e San Jose, CA, September 19-22, 2010 $v S. [1-8] $1 210 $a New York $c IEEE $d 2010 675 $v 1. stred. $z slo 700 -1
$3 eu_un_auth*0037769 $a Asenov $b Asen $4 070 701 -1
$3 eu_un_auth*p0014753 $a Cheng $b Binjie $4 070 701 -1
$3 eu_un_auth*0037765 $a Dideban $b D. $4 070 701 -1
$3 eu_un_auth*p0056135 $a Kováč $b Urban $f 1976- $p EUBFNHKFI $9 50 $4 070 $T Katedra financií FNH 701 -1
$3 eu_un_auth*0037766 $a Moezi $b N. $4 070 701 -1
$3 eu_un_auth*0037784 $a Millar $b Campbell $4 070 701 -1
$3 eu_un_auth*0037768 $a Roy $b Gareth $4 070 701 -1
$3 eu_un_auth*0037776 $a Brown $b Adrew R. $4 070 701 -1
$3 eu_un_auth*0037775 $a Roy $b Scott $4 070 801 -0
$a SK $b BA004 $c 20110407 $g AACR2 856 4-
$u http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=05617627
Počet záznamov: 1