KOVÁČ, Urban et al. Compact model extraction from quantum corrected statistical Monte Carlo simulation of random dopant induced drain current variability. In ASDAM 2010 : 8th international conference on Advanced Semiconductor Devices & Microsystems : conference proceedings, Smolenice Castle, Slovakia 25-27 October 2010. - Bratislava : Microelectronics department Faculty of electrical engineering and information technology Slovak university of technology in Bratislava, 2010. ISBN 978-1-4244-8574-1, s. 317-320. Dostupné na : <http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5666361>