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1. Hierarchical Simulation of Statistical Variability
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200 | 1- | $a Hierarchical Simulation of Statistical Variability $e From 3-D MC with "Ab Initio” Ionized Impurity Scattering to Statistical Compact Models $f Urban Kováč, Craig Alexander, Gareth Roy, Craig Riddet, Binjie Cheng, Asen Asenov |
463 | -1 | $1 001 eu_un_cat*0270036 $1 011 $a 1557-9646 $1 011 $a 0018-9383 $1 200 1 $a IEEE Transactions on Electron Devices $v Vol. 57, no. 10 (2010), s. 2418-2426 $1 210 $a New York $c IEEE Electron Devices Society |
541 | 1- | $a Hierarchická simulácia štatistickej variability |
675 | $v 1. stred. $z slo | |
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701 | -1 | $3 eu_un_auth*0037785 $a Riddet $b Craig $4 070 $9 0,01 |
701 | -1 | $3 eu_un_auth*p0014753 $a Cheng $b Binjie $4 070 $9 0,01 |
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856 | 4- | $u http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5551189 |