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1. Modeling and simulation of transistor and circuit variability and reliability
SYS | 0127863 | |
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100 | $a 20110407a2010łłłłm$$y0sloc0103$$$$ba | |
101 | 0- | $a eng $d eng |
102 | $a US | |
200 | 1- | $a Modeling and simulation of transistor and circuit variability and reliability $f Asen Asenov, Binjie Cheng, D. Dideban, Urban Kováč, N. Moezi, Campbell Millar, Gareth Roy, Adrew R. Brown, Scott Roy |
463 | -1 | $1 010 $a 978-1-4244-5760-1 $1 200 1 $a Custom Integrated Circuits Conference (CICC) $b elektronický dokument $e 32nd annual CICC $e San Jose, CA, September 19-22, 2010 $v S. [1-8] $1 210 $a New York $c IEEE $d 2010 |
675 | $v 1. stred. $z slo | |
700 | -1 | $3 eu_un_auth*0037769 $a Asenov $b Asen $4 070 |
701 | -1 | $3 eu_un_auth*p0014753 $a Cheng $b Binjie $4 070 |
701 | -1 | $3 eu_un_auth*0037765 $a Dideban $b D. $4 070 |
701 | -1 | $3 eu_un_auth*p0056135 $a Kováč $b Urban $p EUBFNHKFI $9 50 $4 070 $T Katedra financií FNH |
701 | -1 | $3 eu_un_auth*0037766 $a Moezi $b N. $4 070 |
701 | -1 | $3 eu_un_auth*0037784 $a Millar $b Campbell $4 070 |
701 | -1 | $3 eu_un_auth*0037768 $a Roy $b Gareth $4 070 |
701 | -1 | $3 eu_un_auth*0037776 $a Brown $b Adrew R. $4 070 |
701 | -1 | $3 eu_un_auth*0037775 $a Roy $b Scott $4 070 |
801 | -0 | $a SK $b BA004 $c 20110407 $g AACR2 |
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