Vytlačiť
1. Simulation of Statistical Variability in Nano-CMOS Transistors Using Drift-diffusion, Monte Carlo and Non-equilibrium Green's Function Techniques
:ASENOV, Asen et al. Simulation of Statistical Variability in Nano-CMOS Transistors Using Drift-diffusion, Monte Carlo and Non-equilibrium Green's Function Techniques. In Journal of computational electronics. - [USA] : SpringerLink, 2009. ISSN 1572-8137, october 2009, vol. 8, no. 3-4, s. 349-3723. Dostupné na : <http://www.springerlink.com/content/16664q8604ng7qqu>