Výsledky vyhľadávania
- BROWN, Adrew R. et al. Use of Density Gradient Quantum Corrections in the Simulation of Statistical Variability in MOSFETs. - Registrovaný: SCOPUS, Registrovaný: Web of Science. In Journal of computational electronics. - [USA] : SpringerLink, 2010. ISSN 1572-8137, december 2010, vol. 9, no. 3-4, s. 187-196.
článok
- ASENOV, Asen et al. Modeling and simulation of transistor and circuit variability and reliability. In Custom Integrated Circuits Conference (CICC) : 32nd annual CICC. - New York : IEEE, 2010. ISBN 978-1-4244-5760-1, s. [1-8]. Dostupné na : <http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=05617627>
článok
- ASENOV, Asen et al. Simulation of Statistical Variability in Nano-CMOS Transistors Using Drift-diffusion, Monte Carlo and Non-equilibrium Green's Function Techniques. In Journal of computational electronics. - [USA] : SpringerLink, 2009. ISSN 1572-8137, october 2009, vol. 8, no. 3-4, s. 349-3723. Dostupné na : <http://www.springerlink.com/content/16664q8604ng7qqu>
článok
- ASENOV, Asen et al. Advanced simulation of statistical variability and reliability in nano CMOS transistors. In IEEE International electron devices meeting 2008 : San Francisco, CA, December 15-17, 2008. - New York : IEEE, 2008. ISBN 978-1-4244-2377-4. Dostupné na : <http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4796712&tag=1>
článok