Výsledky vyhľadávania
- KOVÁČ, Urban et al. Hierarchical Simulation of Statistical Variability : From 3-D MC with "Ab Initio” Ionized Impurity Scattering to Statistical Compact Models. In IEEE Transactions on Electron Devices. - New York : IEEE Electron Devices Society. ISSN 1557-9646, 2010, vol. 57, no. 10, s. 2418-2426. Dostupné na : <http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5551189>
článok
- IEEE Transactions on Electron Devices. - Registrovaný: Current Contents Connect, Registrovaný: Web of Science, Registrovaný: Scopus. New York : IEEE Electron Devices Society. 12x ročne. ISSN 1557-9646. Dostupné na : https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=16
časopis