Výsledky vyhľadávania
- KOVÁČ, Urban et al. A novel approach to the statistical generation of non-normal distributed PSP compact model parameters using a nonlinear power method. In SISPAD 2010 : 15th International conference on simulation of semiconductor processes and devices, september 6-8, 2010, Bologna, Italy. - USA : IEEE, 2010. ISBN 978-1-4244-7699-2, s. 125-128. Dostupné na : <http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5604552>
článok
- ASENOV, Asen et al. Modeling and simulation of transistor and circuit variability and reliability. In Custom Integrated Circuits Conference (CICC) : 32nd annual CICC. - New York : IEEE, 2010. ISBN 978-1-4244-5760-1, s. [1-8]. Dostupné na : <http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=05617627>
článok