Výsledky vyhľadávania
- KOVÁČ, Urban et al. Hierarchical Simulation of Statistical Variability : From 3-D MC with "Ab Initio” Ionized Impurity Scattering to Statistical Compact Models. In IEEE Transactions on Electron Devices. - New York : IEEE Electron Devices Society. ISSN 1557-9646, 2010, vol. 57, no. 10, s. 2418-2426. Dostupné na : <http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5551189>
článok
- ASENOV, Asen et al. Advanced simulation of statistical variability and reliability in nano CMOS transistors. In IEEE International electron devices meeting 2008 : San Francisco, CA, December 15-17, 2008. - New York : IEEE, 2008. ISBN 978-1-4244-2377-4. Dostupné na : <http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4796712&tag=1>
článok